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Plasma-Surface Interaction Data Set 212

Sputtering of N+ on Si(pc) at 300 K

  1. B144: W. Eckstein, "Sputtering Yields. In: Sputtering by Particle Bombardment", Topics in Applied Physics 110 (2007). [https://doi.org/10.1007/978-3-540-44502-9_3]

Sputtering of N+ on Si(pc) at 300 K

angle = 0.0 deg E /eV P
16.70.0
19.940.0001361
23.810.0006644
28.440.001934
33.960.004542
40.560.009427
48.440.01794
57.850.03175
69.080.05248
82.50.08094
98.520.1164
117.70.1565
140.50.1978
167.80.2377
200.40.2745
239.30.3077
285.80.3376
341.30.3646
407.60.3894
486.80.4124
581.30.4338
694.30.4539
829.10.4726
990.10.4899
1182.00.5058
1412.00.52
1686.00.5325
2014.00.5431
2405.00.5515
2872.00.5575
3430.00.561
4096.00.5618
4892.00.5596
5842.00.5545
6977.00.5464
8332.00.5353
9951.00.5212
11880.00.5044
14190.00.4851
16950.00.4636
20240.00.4403
24170.00.4156
28870.00.3899
34470.00.3636
41170.00.3372
49160.00.3109
58710.00.2853
70120.00.2604
83740.00.2367

Fit Function: SPTEEX

\[Y(E) = \frac{q}{2} \frac{\left( \frac{E}{E_\mathrm{th}} - 1 \right)^\mu \ln(1 + 1.2288\epsilon)}{\lambda + \left( \frac{E}{E_\mathrm{th}} - 1 \right)^\mu \left[ \epsilon + 0.1728\sqrt{\epsilon} + 0.008\epsilon^{0.1504} \right]}\]
Coefficients
Fit range

E = 16.7 – 100000