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Plasma-Surface Interaction Data Set 216

Sputtering of Kr+ on Si(pc) at 300 K

  1. B144: W. Eckstein, "Sputtering Yields. In: Sputtering by Particle Bombardment", Topics in Applied Physics 110 (2007). [https://doi.org/10.1007/978-3-540-44502-9_3]

Sputtering of Kr+ on Si(pc) at 300 K

angle = 0.0 deg E /eV P
39.580.0
46.440.000109
54.50.000502
63.950.001394
75.030.003144
88.040.006321
103.30.01178
121.20.02077
142.20.03493
166.90.05627
195.80.08687
229.80.1284
269.60.1814
316.40.2449
371.20.3167
435.60.3936
511.10.4726
599.70.5518
703.70.6299
825.70.7066
968.90.7821
1137.00.857
1334.00.9316
1565.01.007
1837.01.082
2155.01.159
2529.01.236
2967.01.314
3482.01.393
4085.01.473
4794.01.553
5625.01.634
6600.01.714
7744.01.793
9087.01.871
10660.01.947
12510.02.021
14680.02.092
17230.02.159
20210.02.222
23720.02.28
27830.02.333
32650.02.379
38310.02.418
44960.02.449
52750.02.472
61900.02.486
72630.02.49
85220.02.483

Fit Function: SPTEEX

\[Y(E) = \frac{q}{2} \frac{\left( \frac{E}{E_\mathrm{th}} - 1 \right)^\mu \ln(1 + 1.2288\epsilon)}{\lambda + \left( \frac{E}{E_\mathrm{th}} - 1 \right)^\mu \left[ \epsilon + 0.1728\sqrt{\epsilon} + 0.008\epsilon^{0.1504} \right]}\]
Coefficients
Fit range

E = 39.58 – 100000