Process | HCX: Charge Transfer, HIN: Ionization, COM: Composite Process with Multiple Channels |
Channel |
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Data type | cross section | uploaded on 2022-11-11 |
Comment | Fit based on equation (9). The cross-section was attribited 10% reltive error based on experience featured in Schweinzer et al. ADNDT 72 239 1999. |
Method | AOCC: Atomic‐orbital close‐coupling |
Frame | Target |
Columns |
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Threshold | 3.200 eV |
Uncertainty | 10 % |
Ref |
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Data | Download (data from fit) |
Fit Function |
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Fit Coefficients |
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x-range | 0.2 – |